This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. #xB7; Most up-to-date coverage of design for testability.

可测性设计 DFT的权威资料 经典实用不可多得

此应用程序从ISCAS89网表计算组合SCOAP和顺序SCOAP参数（CC0，CC1，CO，SC0，SC1，SO）和可测性指标参数。 它还执行PODEM算法，以针对单个卡在0或1故障处的网络来检查网络的可测试性。

VLSI Test Principles and Architectures Design for Testability 集成电路测试经典教材 清华老师推荐

测试性的国际标准，美国军方标准，测试性设计的指导性文件

一本很好的关于VLSI测试的书，英文版相当不错，推荐给大家！