非常详细的DFT入门资料，详细介绍了常见的DFT模型，以及Scan mode测试技术。最后介绍了ATPG Flow。

该文档主要描述了SOC芯片中的DFT设计实施，主要内容有DFT、ATPG等内容，对学习集成电路设计很有帮助~！

超大规模集成电路可测试性设计，内容包含ATPG、BIST、JTAG等，包含功能测试、直流测试、交流测试及Open/Short、闩锁效应等内容。

TetraMAX ® ATPG User Guide Version L-2016.03-SP2, June 2016 The TetraMAX ATPG User Guide describes TetraMAX ATPG usage and methodology. TetraMAX ATPG is used to check testability design rules and to automatically generate manufacturing test vectors for a logic design. This manual provides some background material on design-for-test (DFT) cone timepts, especially test terminology and scan design techniques. You can obtain more information on TetraMAX ATPG features and commands by accessing TetraMAX Help.