DS算法

D-S证据理论的融合思想主要体现在待识别对象的多个证据的基本概率分配函数通过某种规则融合在一起，求出所有证据的总支持程度，证据理论给出了多源数据的组合规则

触摸屏chsc5448手册

dynamic parametric test system for discrete semiconductors The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests. Test Heads, which are designed for a specific type of transient test, mate to a special Test Head Receiver on the mainframe. While Test Heads are designed to perform only one specific test, personality boards within each Test Head reconfigure the Test Head for a specific device, device package, and various device circuit arraignments.

汽车模型DS格式-3DS格式.rar

海康威视DS-19M00-MN/K报警模块搜索修改软件，修改IP地址，模块ID等

WK2114_DS_CN_V010_，USB转串口WK2114_DS_CN_V010_，USB转串口

DS6-K5B计算机联锁系统结构图

NI的PCIe-6343数据采集卡数据手册

The LTR-578ALS-031WA is an integrated low voltage I2C ambient light sensor (ALS), and proximity sensor (PS), with built-in emitter in a single miniature chipled lead-free surface mount package.