ITC57300 分立器件动态参数测试系统 DS

dynamic parametric test system for discrete semiconductors The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests. Test Heads, which are designed for a specific type of transient test, mate to a special Test Head Receiver on the mainframe. While Test Heads are designed to perform only one specific test, personality boards within each Test Head reconfigure the Test Head for a specific device, device package, and various device circuit arraignments.