支持IBMDS4700和4800管理软件，可进行视图化查看存储情况，进行硬件管理。IBM System Storage DS Storage Manager version10.7,由于上传限制，分成了2个压缩包。.。。。。。。。
2023-04-18 16:10:19
395.66MB
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1、在使用视频监控设备时，对于监听接口的使用与维护，请您严格遵守适用的法律、法规要求。出于非法目地使用视频监控设备、探听他人隐私等，均属于非法。
2、在设备固件升级的过程中请勿断电或进行其他的操作，固件升级设备有风险，请确认是否一定要升级设备。设备固件升级后可能会出现参数恢复默认的情况。
一、升级文件说明
1、适用型号：_________________
2、程序版本：__________________
3、程序获取方式：详见附件程序包
2023-04-05 15:42:58
59.11MB
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D-S证据理论的融合思想主要体现在待识别对象的多个证据的基本概率分配函数通过某种规则融合在一起，求出所有证据的总支持程度，证据理论给出了多源数据的组合规则
2023-03-29 12:59:54
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dynamic parametric test system for discrete semiconductors
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
Test Heads, which are designed for a specific type of transient test, mate to a special Test Head Receiver on the mainframe. While Test Heads are designed to
perform only one specific test, personality boards within each Test Head reconfigure the Test Head for a specific device, device package, and various device circuit arraignments.
2023-03-17 11:33:39
414KB
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WK2114_DS_CN_V010_，USB转串口WK2114_DS_CN_V010_，USB转串口
2023-02-23 16:23:18
477KB
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