FPGA读写SD卡测试实验 Verilog逻辑源码Quartus工程文件+文档说明.zip

FPGA读写SD卡测试实验 Verilog逻辑源码Quartus工程文件+文档说明,FPGA型号Cyclone4E系列中的EP4CE6F17C8，Quartus版本17.1。 // 2017/6/19 meisq 1.0 Original //*******************************************************************************/ module sd_card_test( input clk, input rst_n, input key1, output SD_nCS, output SD_DCLK, output SD_MOSI, input SD_MISO, output [5:0] seg_sel, output [7:0] seg_data ); parameter S_IDLE = 0; parameter S_READ = 1; parameter S_WRITE = 2; parameter S_END = 3; reg[3:0] state; wire sd_init_done; reg sd_sec_read; wire[31:0] sd_sec_read_addr; wire[7:0] sd_sec_read_data; wire sd_sec_read_data_valid; wire sd_sec_read_end; reg sd_sec_write; wire[31:0] sd_sec_write_addr; reg [7:0] sd_sec_write_data; wire sd_sec_write_data_req; wire sd_sec_write_end; reg[9:0] wr_cnt; reg[9:0] rd_cnt; wire button_negedge; reg[7:0] read_data; ax_debounce ax_debounce_m0 ( .clk (clk), .rst (~rst_n), .button_in (key1), .button_posedge (), .button_negedge (button_negedge), .button_out () ); wire[6:0] seg_data_0; seg_decoder seg_decoder_m0( .bin_data (read_data[3:0]), .seg_data (seg_data_0) ); wire[6:0] seg_data_1; seg_decoder seg_decoder_m1( .bin_data (read_data[7:4]), .seg_data (seg_data_1) ); seg_scan seg_scan_m0( .clk (clk), .rst_n (rst_n), .seg_sel (seg_sel), .seg_data (seg_data), .seg_data_0 ({1'b1,7'b1111_111}), .seg_data_1 ({1'b1,7'b1111_111}), .seg_data_2 ({1'b1,7'b1111_111}), .seg_data_3 ({1'b1,7'b1111_111}), .seg_data_4 ({1'b1,seg_data_1}), .seg_data_5 ({sd_init_done,seg_data_0}) ); always@(posedge clk or negedge rst_n) begin if(rst_n == 1'b0) wr_cnt <= 10'd0; else if(state == S_WR