This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices’ operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as burn-in, may be used to screen for infant mortality related failures. The detailed use and application of burn-in is outside the scope of this document. free for $54

完整英文版JEDEC JESD22-A108F：2017 Temperature, Bias, And Operating Life（温度，偏置和使用寿命）。本测试用于确定随时间推移偏置条件和温度对固态设备的影响。 它以加速的方式模拟设备的运行状况，主要用于设备鉴定和可靠性监控。 使用短时间的高温偏压寿命的一种形式（通常称为老化）可用于筛查与婴儿死亡率有关的故障。 老化的详细使用和应用不在本文档的范围之内。