minixml是适合嵌入式系统的xml解析器，支持dom

在嵌入式系统中选用常用SRAM型号，在FPGA中选用常用SRAM型号

文中设计了基于SQLITE数据库的温湿度实时存储程序。在该程序的设计过程中利用了嵌入式Linux平台和SQLITE体系结构特点，并考虑温湿度实时存储的要求，分别进行了系统时间的表创建、动态数据实时插入等程序的设计。在程序设计完成之后，系统进行了多次实验，程序没出现"跑飞"现象，实验结果表明该程序运行稳定，能够满足实时存储的要求。

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本项目是基于STM32F103的纸张计数显示装置设计，采用的方案是FDC2214电容数字传感器。该项目可实现一键自动检测，无需手动按压等操作。开源资料包括展示视频、设计报告、3D模型（使用Rhino打开）、PCB文件、完整程序。

针对仓库储藏货物的应用需求和特点，对仓储系统进行分析和研究，提出了一种仓储管理系统的整体设计方案，以ARM Cortex-A8为核心处理器，Linux嵌入式系统为仓储管理的控制系统，利用QT提供的各种资源建立仓储管理系统控制软件，实现了仓库的智能化管理。

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本科毕业论文，关于Android的嵌入式系统研究及开发，借助Android系统，进一步学习嵌入式系统的开发。

设计应用了最先进的ＡＲＭ嵌入式技术，利用ＡＲＭ丰富的内部设备，实现了光谱数据的传输和基于触摸屏的人机交互平台。实现近红外光谱仪器操作简单化，体现了ＡＲＭ微处理器的优胜之处。 　　１．　引言 　　近红外光谱主要是由分子振动的非谐振性使分子振动从基态向高能级跃迁时产生的，记录的主要是含氢基团Ｃ－Ｈ、Ｏ－Ｈ、Ｎ－Ｈ等振动的倍频和合频吸收［１］，具有丰富的物质结构和组成信息，非常适合用于碳氢有机物质的组成性质测量。近红外光谱作为迅速崛起的光谱分析技术在分析测试领域中起的作用越来越引起人们关注，由于样品在分析时基本不需要处理，且不破坏和消耗样品，自身又无环境污染，近红外光谱分析技术堪称是绿色分析仪器

Repair techniques for nanoscale memories are becoming more important to cope with ever-increasing “errors” causing degraded yield and reliability. In fact, without repair techniques, even modern CMOS LSIs, such as MPUs/SoCs, in which memories have dominated the area and performances, could not have been successfully designed. Indeed, various kinds of errors have been prominent with larger capacity, smaller feature size, and lower voltage operations of such LSIs. The errors are categorized as hard/soft errors, timing/voltage margin errors, and speed-relevant errors. Hard/soft errors and timing/voltage margin errors, which occur in a chip, are prominent in a memory array because the array comprises memory cells having the smallest size and largest circuit count in the chip. In particular, coping with the margin errors is vital for low-voltage nanoscale LSIs, since the errors rapidly increase with device and voltage scaling. Increase in operating voltage is one of the best ways to tackle the issue. However, this approach is unacceptable due to intolerably increased power dissipation, calling for other solutions by means of devices and circuits. Speed-relevant errors, which are prominent at a lower voltage operation, comprise speed-degradation errors of the chip itself and intolerably wide chip-to-chip speed-variation errors caused by the ever-larger interdie designparameter variation. They must also be solved with innovative devices and circuits. For the LSI industry, in order to flourish and proliferate, the problems must be solved based on in-depth investigation of the errors.